Device Characterization
Through a collaboration with Hewlett Packard Enterprises, the QSF houses an optical table setup for the characterization of optoelectronic devices such as amplifiers, lasers, modulators, photodetectors, and passive components. Sample stages are large enough for full 100-mm wafers, are temperature controlled, and can be set anywhere between 10 and 80°C. The setups are compatible with both edge coupling and near vertical coupling of light.
The HPE test equipment is focused on making optical link tests. Included are current/voltage source meters, tunable lasers, optical power meters, optical spectrum analyzers, pattern generators, an arbitrary waveform generator, external optical modulators, an electrical spectrum analyzer (50 GHz, up to 75 GHz with a downconverter which is available), an autocorrelator, tunable optical filters, a lightwave component analyzer, and a semiconductor device parameter analyzer (LCR-meter). While most of the equipment is tailored for 1310 nm, several tools are wavelength agnostic. In addition, an automatic probe station capable of fully automatic testing of wafers up to 200 mm in size is currently being installed.
How-to Information
- Steps to Access the Quantum Structures Facility
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- Contact QSF staff to get trained on the instrument.
- Apply to CNSI for electronic door access to the facility.
- QSF Staff will add you to the FBS reservation system
- Acknowledging Support
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Please remember to acknowledge CNSI resources in scientific publications and presentations by including this statement:
“The authors acknowledge the use of the Quantum Structures Facility within the California NanoSystems Institute, supported by the University of California, Santa Barbara and the University of California, Office of the President.”
For work related to the Quantum Foundry also include:
"This work is supported by the National Science Foundation through Enabling Quantum Leap: Convergent Accelerated Discovery Foundries for Quantum Materials Science, Engineering and Information (Q-AMASE-i) award number DMR-1906325."
